Differential Burn‐in and Reliability Screening Policy Using Yield Information Based on Spatial Stochastic Processes

Younghak Shim, Jung Yoon Hwang

Journal of Korean Society of Industrial and Systems Engineering :: Vol.35 No.4 pp.1-9

DOI:https://doi.org/10.11627/jkise.2012.35.4.1

Multivariate Gamma-Poisson Model and Parameter Estimation for Polytomous Data : Application to Defective Pixels of LCD

Jung-Hoon Ha

Journal of Korean Society of Industrial and Systems Engineering :: Vol.34 No.1 pp.42-51

DOI:

Estimation of Defect Clustering Parameter Using Markov Chain Monte Carlo

Chung-Hun Ha, Chang Jun-Hyun, Kim Joon-Hyun

Journal of Korean Society of Industrial and Systems Engineering :: Vol.32 No.3 pp.99-109

DOI:

Dynamic Yield Improvement Model Using Neural Networks

Hyun-Chul Jung*, Kang Chang-Wook**, Kang Hae-Woon*

Journal of Korean Society of Industrial and Systems Engineering :: Vol.32 No.2 pp.132-139

DOI:

Quality and Productivity Improvement by Clustering Product Database Information in Semiconductor Testing Floor

Tae-Sung Kim, Lim Ik-Sung, Koo Il-Sup,

Journal of Korean Society of Industrial and Systems Engineering :: Vol.23 No.60 pp.73-81

DOI: