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Differential Burn‐in and Reliability Screening Policy Using Yield Information Based on Spatial Stochastic Processes

Younghak Shim, Jung Yoon Hwang

Journal of Korean Society of Industrial and Systems Engineering :: Vol.35 No.4 pp.1-9

DOI:https://doi.org/10.11627/jkise.2012.35.4.1
Open abstract

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