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Detection of Defect Patterns on Wafer Bin Map Using Fully Convolutional Data Description (FCDD)
Seung-Jun Jang
, Suk Joo BaeJournal of Korean Society of Industrial and Systems Engineering :: Vol.46 No.2 pp.1-12
DOI:https://doi.org/10.11627/jksie.2023.46.2.001
Open abstract
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Text Based Explainable AI for Monitoring National Innovations
Jung Sun Lim
, Seoung Hun BaeJournal of Korean Society of Industrial and Systems Engineering :: Vol.45 No.4 pp.1-7
DOI:https://doi.org/10.11627/jksie.2022.45.4.001
Open abstract
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A Methodology for Bankruptcy Prediction in Imbalanced Datasets using eXplainable AI
Sun-Woo Heo
, Dong Hyun BaekJournal of Korean Society of Industrial and Systems Engineering :: Vol.45 No.2 pp.65-76
DOI:https://doi.org/10.11627/jksie.2022.45.2.065
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Explainable AI Application for Machine Predictive Maintenance
Kang Min Cheon
, Jaekyung YangJournal of Korean Society of Industrial and Systems Engineering :: Vol.44 No.4 pp.227-233
DOI:https://doi.org/10.11627/jksie.2021.44.4.227
Open abstract