ISSN : 2005-0461(Print)
ISSN : 2287-7975(Online)
ISSN : 2287-7975(Online)
다수 위치 측정에서 최소 기준에 의한 공정능력지수
The Process Capability Index of Minimum Base on the Multiple Measuring Locations
Abstract
Process capability indices (PCls) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. The previous studies have measured only one location on each part in the case of single variate. To calculate the reliable process capability, a couple of measuring locations on each part are required. In this paper, we propose a new system process capability index SCpm(m) which is the minimum value of the location PCls.
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