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ISSN : 2005-0461(Print)
ISSN : 2287-7975(Online)
Journal of Society of Korea Industrial and Systems Engineering Vol.34 No.4 pp.114-119
DOI :

다수 위치 측정에서 최소 기준에 의한 공정능력지수

이도경
금오공과대학교 산업공학부

The Process Capability Index of Minimum Base on the Multiple Measuring Locations

Do-Kyung Lee
Department of Industrial Engineering, Kumoh National Institute of Technology
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Abstract

Process capability indices (PCls) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. The previous studies have measured only one location on each part in the case of single variate. To calculate the reliable process capability, a couple of measuring locations on each part are required. In this paper, we propose a new system process capability index SCpm(m) which is the minimum value of the location PCls.

Reference