ISSN : 2005-0461(Print)
ISSN : 2287-7975(Online)
ISSN : 2287-7975(Online)
Process Capability Analysis by the Experiment of Chips
Abstract
Process capability is reflected on four major factors such as materials, equipments. skill of operators, and methods. The status of the process is typically represented by the mean value 〔μ〕as a central tendancy, and the variance 〔σ²〕 as a magnitude of dispersion. This paper analyzes the process capability by the experiment of chips is accounted on a population from the process. So, this paper analyzes the next four cases : (1) When the process distribution is changed from N[μ¹, σ²〕to N〔μ₂,σ² 〕. (2) When the process distribution is changed from N[μ₂,σ² ] to N[,μ₂,σ² ]. (3) When the population is compounded by the different two distributions of N〔μ₁,σ² 〕and N〔μ ,σ½ 〕. (4) When the population is compounded by the different two distributions of N〔μ ,σ½ 〕 and N[μ,σ].
Chips 실험에 의한 공정능력의 해석
초록
- SOGOBO_1987_v10n16_63.pdf425.7KB